23 March 2015
ELECTRONIC TEST EQUIPMENT, INTERMITTENT FAULT DETECTION AND
ISOLATION FOR CHASSIS AND BACKPLANE CONDUCTIVE PATHS
This specification is approved for use by all Departments and Agencies of the
Department of Defense.
1.1 Scope. This specification covers the minimum performance requirements for
equipment to detect and isolate nanosecond, microsecond and millisecond conductive paths (see
6.4.4) and intermittent faults (see 6.4.2), which can occur in any and all of the hundreds to
thousands of Line Replaceable Unit (LRU)/Weapon Replaceable Assembly (WRA) chassis and
backplane circuits and their wire harnesses. This specification is not intended to address hard
opens (see 6.4.11), shorts (see 6.4.12), nor constant function failures found in routine electronics
1.2 Classification. Diagnostic equipment is classified by its intermittent fault duration
detection capability, as follows:
Category 1. Short duration intermittent faults (see 6.4.5) that are under 100 nanoseconds
across all LRU/WRA backplane circuits and associated wire harnesses.
Category 2. Intermediate duration intermittent faults (see 6.4.6) that are 101 nanoseconds
to 500 microseconds across all LRU/WRA backplane circuits and associated wire
Category 3. Long duration intermittent faults (see 6.4.7) that are 501 microseconds to 5
milliseconds across all LRU/WRA backplane circuits and associated wire harnesses.
Comments, suggestions, or questions on this document should be addressed to the Naval Air
Systems Command, (Commander, Naval Air Warfare Center Aircraft Division, Code
412000B120-3, Highway 547, Joint Base MDL, NJ 08733-5100) or emailed to
firstname.lastname@example.org. Since contact information can change, you may want to verify the
currency of this address information using the ASSIST online database at
DISTRIBUTION STATEMENT A. Approved for public release; distribution unlimited.
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